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Instruments for Material structures study
- OM[Click for details]
- X-RAY[Click for details]
- C-SAM (Scanning Acoustic Microscope)[Click for details]
- Decap[Click for details]
- X-Section preparation[Click for details]
- FIB (Focus Ion Beam)[Click for details]
- SEM (scanning electron microscope)[Click for details]
- TEM (Transmission electron microscope)[Click for details]
- EDS (Energy Dispersive Spectrometer)[Click for details]
- FTIR (Fourier Transform infrared spectroscopy)[Click for details]
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